The NanoCharacterization Core provides processing of tissues and cells for topographic imaging of specimens using scanning electron microscopy (SEM). High-resolution imaging and elemental analysis of nanomaterials using SEM/scanning transmission electron microscopy (STEM) and elemental dispersive spectroscopy (EDS) provide detailed material characterization. The core facility also strives to provide assistance with novel imaging applications.
Hitachi SU-8230 high-resolution scanning electron microscope - equipped with scanning transmission electron, three secondary electron, and two energy dispersive x-ray spectroscopy (EDS) detectors. Combined low and high energy imaging enable characterization of surface and internal structures, with EDS analysis providing elemental recognition of materials enabling the identification of elements and their relative proportion.
Leica EM ACE600 Sputtering and Carbon Thread Coater - thin, fine-grain coating of non-conductive samples for scanning electron microscopy using the ultra-high resolution upper secondary detector.